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A novel defect depth measurement method based on nonlinear system identification for pulsed thermographic inspection

Zhao, Yifan; Mehnen, Jorn; Sirikham, Adisorn; Roy, Rajkumar (Elsevier, 2016-08-30)

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Author
- Mehnen, Jorn (1)
- Roy, Rajkumar (1)
- Sirikham, Adisorn (1)
- Zhao, Yifan (1)
Subject
- Degradation assessment (1)
- NDT (1)
- Nonlinearity (1)
- SHM (1)
- Thermography (1)
- Uncertainty (1)
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Date Issued
- 2016 (1)