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Determination of thermal wave reflection coefficient to better estimate defect depth using pulsed thermography

Sirikham, Adisorn; Zhao, Yifan; Mehnen, Jorn (Elsevier, 2017-08-22)

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Author
- Mehnen, Jorn (1)
- Sirikham, Adisorn (1)
- Zhao, Yifan (1)
Subject
- 3D heat conduction (1)
- composite defects (1)
- Least-squares fitting (LSF) (1)
- Non-destructive testing (NDT) (1)
- Optimisation (1)
- Signal-noise-ratio (SNR) (1)
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Date Issued
- 2017 (1)