Ultrahigh resolution of lead zirconate titanate 30/70 domains as imaged by piezoforce microscopy.

Dunn, Steve; Shaw, Christopher P.; Huang, Zhaorong; Whatmore, Roger W.

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dc.contributor.author	Dunn, Steve
dc.contributor.author	Shaw, Christopher P.
dc.contributor.author	Huang, Zhaorong
dc.contributor.author	Whatmore, Roger W.
dc.date.accessioned	2006-11-14T15:31:35Z
dc.date.available	2006-11-14T15:31:35Z
dc.date.issued	2006-11-14T15:31:35Z
dc.identifier.citation	Dunn S, Shaw CP, Huang Z, Whatmore RW. (2002) Ultrahigh resolution of lead zirconate titanate 30/70 domains as imaged by piezoforce microscopy. Nanotechnology, Volume 13, Issue 4, 2002, pp. 456-459
dc.identifier.uri	http://hdl.handle.net/1826/1228
dc.identifier.uri	http://dx.doi.org/10.1088/0957-4484/13/4/303
dc.description.abstract	Piezoforce microscopy (PFM) has been used to determine the domain structure of lead zirconate titanate (PZT) (30/70) on an indium tin oxide (ITO)/glass substrate with a TiO2 boundary layer. The PZT nucleates into the perovskite form in a random crystallographic manner, which leads to a random domain structure in the final film. Using PFM it has been possible to visualize the domain structure of the PZT and determine that the domain structure has features as fine as 8 nm herringbone patterns. The possible impact of these structures for future devices utilizing nanoscale features of PZT and especially FeRAM developments is highlighted.	en
dc.format.extent	53916 bytes
dc.format.extent	360971 bytes
dc.format.mimetype	application/pdf
dc.format.mimetype	application/pdf
dc.language.iso	en	en
dc.title	Ultrahigh resolution of lead zirconate titanate 30/70 domains as imaged by piezoforce microscopy.	en
dc.type	Article	en