Microwaves enable activated plasma figuring for ultra-precision fabrication of optics

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dc.contributor.author Bennett, Adam
dc.contributor.author Jourdain, Renaud
dc.contributor.author Kirby, Paul
dc.contributor.author MacKay, P.
dc.contributor.author Shore, Paul
dc.contributor.author Nicholls, John R.
dc.contributor.author Morantz, Paul
dc.date.accessioned 2016-09-27T12:52:03Z
dc.date.available 2016-09-27T12:52:03Z
dc.date.issued 2016-06-30
dc.identifier.citation Bennett A, Jourdain R, Kirby P, MacKay P, Shore P, Nicholls J & Morantz P (2016) Microwaves enable activated plasma figuring for ultra-precision fabrication of optics. 16th International Conference of the European Society for Precision Engineering and Nanotechnology (EUSPEN), 30th May - 3rd June 2016, Nottingham, UK. en_UK
dc.identifier.uri https://dspace.lib.cranfield.ac.uk/handle/1826/10601
dc.identifier.uri http://www.euspen.eu/knowledge-base/ICE16-O3.1.pdf
dc.description.abstract Activated plasma figuring using microwaves aims at providing highly efficient activated energy beams for rapid fabrication of optics. The chemical nature of this type of energy beam leads to targeting silicon-based materials. Furthermore this technology is proposed to address the needs of ultra-precision optical components. In this paper, we present a novel ADTEC microwavegenerated plasma torch design which is operated at atmospheric pressure. In this study, the plasma torch is fed with either argon or helium carrier gas. However this novel design for Plasma Figuring is targeted at local surface correction of crystal quartz which is a material of great interest for optical systems, such as acousto-optic devices. Also this novel design is targeted at reducing midspatial frequency errors such as waviness, ripple errors and residual sub-aperture tool footprints. These are responsible for the scattering of light at small angles, resulting in optical hazing effects, photonic energy loss and pixel cross-talk. Also the results of a preliminary investigation using Optical Emission Spectroscopy (OES) are reported and discussed. These results show the operat ing range when the main processing parameters are changed: microwave forward power values, gas flow rates and the types of gasses. en_UK
dc.language.iso en en_UK
dc.publisher European Society for Precision Engineering and Nanotechnology en_UK
dc.rights Attribution-NonCommercial 4.0 International
dc.rights.uri http://creativecommons.org/licenses/by-nc/4.0/
dc.subject Microwave plasma en_UK
dc.subject surface figuring en_UK
dc.subject crystal quartz en_UK
dc.subject optical fabrication en_UK
dc.title Microwaves enable activated plasma figuring for ultra-precision fabrication of optics en_UK
dc.type Conference paper en_UK


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