We demonstrate a novel imaging architecture to collect range encoded diffraction patterns from overlapping samples in a single conical shell projection. The patterns were measured in the dark area encompassed by the beam ...

To retrieve crystallographic information from extended sample volumes requires a high-energy probe. The use of X-rays to combine imaging with materials characterisation is well-established. However, if fundamental ...

Diffraction data may be measured using approaches that lead to ambiguity in the interpretation of scattering distributions. Thus, the encoding and decoding of coherent scatter distributions have been considered with a ...