Browsing by Author "Hansford, G. M."

Browsing by Author "Hansford, G. M."

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  • Hansford, G. M.; Turner, S. M. R.; Degryse, Patrick; Shortland, Andrew J. (International Union of Crystallography, 2017-07-01)
    It is shown that energy-dispersive X-ray diffraction (EDXRD) implemented in a back-reflection geometry is extremely insensitive to sample morphology and positioning even in a high-resolution configuration. This technique ...