Busiakiewicz, Adam; Huczko, A.; Dudziak, Tomasz; Puchalski, M.; Kozlowski, W.; Cichomski, M.; Cudzilo, S.; Klusek, Z.; Olejniczak, W.
(Elsevier Science B.V., Amsterdam., 2010-05-01)
For the first time the scanning tunneling microscopy (STM) and scanning
tunneling spectroscopy (STS) are employed to investigate the morphology and the
surface electronic structure of the defective silicon carbide ...