Velis, C. A.; Wagland, Stuart Thomas; Longhurst, Philip J.; Robson, Bryce; Sinfield, Keith; Wise, Stephen; Pollard, Simon J. T.
(American Chemical Society, 2013-12-05)
Laner and Cencic1 comment on Velis et al. (2013)2 clarifying certain points on the use of the material flow analysis (MFA) software STAN3. We welcome the correspondence and the opportunity this exchange provides to discuss ...